The Binet-Simon Measuring Scale for Intelligence: Some Criticisms and Suggestions

This article offers an evaluation of the Binet-Simon Measuring Scale for Intelligence, a 1908 series of tests developed by French psychologists for the diagnosis of the level of intelligence of children. The scale had widespread application at the time, with minor variations to adapt to the needs of American children. By assessing each test and determining a number of flaws, such as overemphasis on “puzzle tests,” the author argues that, beyond small adjustments, an entirely new measuring scale is needed to test intellectual performance.

LEONARD P. AYRES was director of the Division of Education at the Russell Sage Foundation.